Look for us at IEEE MTT-S International Microwave Symposium

Ozark IC will be at the IEEE MTT-S International Microwave Symposium on Sunday, June 16. During the morning workshop, “Operating at the Extreme: RFIC Design Techniques for Operation Beyond the PDK Limits,” CEO Matt Francis will present a tutorial on the Design of Electronics at High Temperature, addressing the challenges and opportunities for design in emerging technologies in electronics operating about 150C. We hope to see you there. https://ims-ieee.org/technical-program/workshops?date=2024-06-16

Ozark IC Quick Turn Additive Prototyping Featured in Advancing Microelectronics Magazine

Developing a new sensor, component, or system is complicated. While modeling and simulation inform your design, there is no substitute for a prototype tested in the relevant environment. To get there, Ozark IC is lowering the barrier to your system feasibility questions in Extreme Environments using unique additive technology. Featured recently in Advancing Microelectronics, our quick turn (QT) systems can go from idea to test in as little as 24 hours – a true game changer for rugged electronics. Learn more in the Power and High Temp issue of Advancing Microelectronics magazine: https://imaps.org/page/Advancing-Microelectronics-Magazine

High-Temperature silicon carbide wafer with Ozark IC designed integrated circuits (Photo courtesy of General Electric Aerospace Research Center)

Ozark IC Team wins DARPA HOTS Award to Develop a High-Speed, High-Temperature Sensor System

A 6-member team, led by Ozark IC, has been selected for a DARPA HOTS award to develop an 800ºC electronic pressure sensing system that will raise the system performance by a factor of 1000 over existing solutions FAYETTEVILLE, ARKANSAS April 2024 – A 6-member team led by Ozark Integrated Circuits Inc. (Ozark IC) in Fayetteville, AR, has been selected for a $10.9M, three-year DARPA HOTS award. The award will allow the team to develop a high-speed (1 MHz), high-temperature (up to 800ºC) electronic pressure sensing system – which represents orders of magnitude speed increase over the current state-of-the art. DARPA’s HOTS (High Operational Temperature Sensors) Program https://www.darpa.mil/news-events/2023-05-12 is a premier program with its major aim to “develop microelectronic sensor technologies […]