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Ozark Integrated Circuits, Inc.
  • Home
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Category: In the News

June 2, 2025In the News

Ozark Integrated Circuits to Attend June 2025 Paris Air Show

FAYETTEVILLE, ARKANSAS MAY 2025 – Ozark Integrated Circuits, Inc. (Ozark IC) will be traveling to Paris, France June 16 to 22 to […]

May 13, 2025August 25, 2025In the News

Ozark IC achieves Cybersecurity Maturity Model Certification Status Final Level 2 (C3PAO)

Ozark Integrated Circuits, Inc. (Ozark IC) recently achieved Cybersecurity Maturity Model Certification Status Final Level 2 (C3PAO) through the CMMC program. We […]

October 30, 2024October 30, 2024In the News

CEO Matt Francis Serves on IEEE Board

In addition to his role at Ozark, CEO Matt Francis is also giving back by serving on the Board of Directors of […]

October 10, 2024Conferences, In the News

Ozark IC to attend Packaging Chips with CHIPS Summit

We are looking forward to contributing to the discussions at the IEEE-USA Packaging Chips with CHIPS Summit. It’s an exciting opportunity to […]

October 7, 2024October 7, 2024In the News, Press Releases

Ozark IC chosen for DOE Phase 2 program for Geothermal Monitoring

The U.S. Department of Energy (DOE) has announced selections totaling $142 million for 123 small business projects for research in multiple areas, […]

August 30, 2024August 30, 2024Conferences, In the News

Ozark IC at TETS 2024

Join us at TETS for an exciting Ozark IC showcase! Stop by our booth in the Exhibit Hall where we’ll be demonstrating […]

July 12, 2024Conferences, In the News

Ozark IC at NAECON 2024

Ozark IC CEO, Dr. A. Matt Francis, will speak at the IEEE National Aerospace and Electronics Conference on Wednesday, July 17, 2024. […]

May 31, 2024Conferences, In the News

Look for us at IEEE MTT-S International Microwave Symposium

Ozark IC will be at the IEEE MTT-S International Microwave Symposium on Sunday, June 16. During the morning workshop, “Operating at the […]

May 10, 2024June 28, 2024In the News, Publications

Ozark IC Quick Turn Additive Prototyping Featured in Advancing Microelectronics Magazine

Developing a new sensor, component, or system is complicated. While modeling and simulation inform your design, there is no substitute for a […]

High-Temperature silicon carbide wafer with Ozark IC designed integrated circuits (Photo courtesy of General Electric Aerospace Research Center)
May 1, 2024May 1, 2024In the News, Press Releases

Ozark IC Team wins DARPA HOTS Award to Develop a High-Speed, High-Temperature Sensor System

A 6-member team, led by Ozark IC, has been selected for a DARPA HOTS award to develop an 800ºC electronic pressure sensing […]

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