A publication on the design and test of asynchronous silicon-carbide integrated circuits, led by U of A student Nathan Kuhns (student of Prof. Di) in the 2016 issue of IEEE Transactions on Device and Materials Reliability.
Kuhns, N., Caley, L., Rahman, A., Ahmed, S., Di, J., Mantooth, H. A., Francis, A.M, Holmes, J. (2016).
Complex High-Temperature CMOS Silicon Carbide Digital Circuit Designs.
IEEE Transactions on Device and Materials Reliability, 16(2), 105–111.