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Author: ozadmin

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Publications

High-Temperature Voltage and Current References in Silicon Carbide CMOS

June 21, 2016 by ozadmin

A great paper led by Ashfaq Rahman, PhD, U of A 2015 graduate of Prof. Mantooth’s, on design of voltage and current references in Silicon Carbide. Rahman, A., Francis, A. M., Ahmed, S., Akula, S. K., Holmes, J., & Mantooth, … Read More

Publications

Complex High-Temperature CMOS Silicon Carbide Digital Circuit Designs

June 21, 2016 by ozadmin

A publication on the design and test of asynchronous silicon-carbide integrated circuits, led by U of A student Nathan Kuhns (student of Prof. Di) in the 2016 issue of  IEEE Transactions on Device and Materials Reliability. Kuhns, N., Caley, L., … Read More

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Press: Ozark IC’s UV Imaging Work Featured in Semiconductor Today

May 23, 2016 by ozadmin
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Conference: 2016 High Temperature Electronics Conference

May 17, 2016 by ozadmin

Ozark IC attended the 2016 IMAPS High Temperature Electronics Conference in Albuquerque, NM.  Three papers were featured by Ozark IC and it’s partners at the University of Arkansas: Francis, A. M., Holmes, J., Chiolino, N., Barlow, M., Abbasi, A., & … Read More

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Press: Ozark IC Featured in IEEE Spectrum

August 5, 2015 by ozadmin
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Press: Ozark IC Venus-focused R&D Featured in EETimes

August 3, 2015 by ozadmin

  NASA Preps Venus ICs. Ozark IC to supply 932 degree PDK. R. Colin Johnson. 8/3/2015 09:50 AM ED

Conferences | Publications

Aerospace 2015, SiC CMOS, SiGe

March 21, 2015 by ozadmin

Ozark IC’s work in design and qualification of silicon carbide technology was featured at the 2015 Aerospace Conference. Francis, A. M., Moudy, T., Holmes, J. A., Rahman, A., Barlow, M., Ahmed, S., & Mantooth, A. (2015). Towards standard component parts … Read More

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700 W. Research Center Blvd., Suite 1203 Fayetteville AR 72701

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